printlogo
http://www.ethz.ch/index_EN
Home
 
print
  

ICARDA-CIMMYT alliance for wheat improvement

11 December 2006 10:15
LFW C5

Dr. S. Rajaram

ICARDA, Syria


Dr. Sanjaya Rajaram joined ICARDA in early 2005 as Director of the newly-formed Megaproject, "Integrated Gene Management", which includes wheat improvement. He worked as a wheat scientist at CIMMYT for 34 years and has special expertise and success with breeding for resistance to the rust diseases, including the use of durable forms of slow-rusting.


Some recent publications

Warburton ML, Crossa J, Franco J, et al.
Bringing wild relatives back into the family: recovering genetic diversity in CIMMYT improved wheat germplasm
EUPHYTICA 149 (3): 289-301 JUN 2006


Das MK, Rajaram S, Mundt CC, et al.
Number of genes controlling slow rusting resistance to leaf rust in five spring wheat cultivars
ANNALS OF APPLIED BIOLOGY 145 (1): 91-94 2004


Rajaram S, Pena RJ, Villareal RL, et al.
Utilization of wild and cultivated emmer and of diploid wheat relatives in breeding
ISRAEL JOURNAL OF PLANT SCIENCES 49: S93-S104 Suppl. S 2001


DeLacy IH, Rajaram S, Cooper M, et al.
The effect of the accumulation of disease resistance genes on the long-term association of a global sample of environments for testing spring bread wheat
THEORETICAL AND APPLIED GENETICS 101 (7): 1164-1172 NOV 2000


Smale M, Singh RP, Sayre K, et al.
Estimating the economic impact of breeding nonspecific resistance to leaf rust in modern bread wheats
PLANT DISEASE 82 (9): 1055-1061 SEP 1998


Sayre KD, Singh RP, Huerta-Espino J, et al.
Genetic progress in reducing losses to leaf rust in CIMMYT-derived Mexican spring wheat cultivars
CROP SCIENCE 38 (3): 654-659 MAY-JUN 1998

 

Wichtiger Hinweis:
Diese Website wird in älteren Versionen von Netscape ohne graphische Elemente dargestellt. Die Funktionalität der Website ist aber trotzdem gewährleistet. Wenn Sie diese Website regelmässig benutzen, empfehlen wir Ihnen, auf Ihrem Computer einen aktuellen Browser zu installieren. Weitere Informationen finden Sie auf
folgender Seite.

Important Note:
The content in this site is accessible to any browser or Internet device, however, some graphics will display correctly only in the newer versions of Netscape. To get the most out of our site we suggest you upgrade to a newer browser.
More information

© 2013 ETH Zurich | Imprint | Disclaimer | 5 January 2007
top